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Nonmetallic Inorganic Materials
 
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Atom Probe Tomography

Atom probe tomography provides a three dimensional chemical analysis of outstanding resolution. Therefore, this method is ideally suited to investigate the complex morphology of nanocrystalline alloys, thin films, and metal/ceramic multilayers. By superposition of an short electric- or laser-pulse with an constant electric field the sample is field evaporated atom-by-atom. The sample is reconstructed using the measured flight time and the point of detection (see Fig. 1).

Relevant Literature

Build Your Own Atom Probe

Thin Film Analysis

Correlative Microscopy

Data Reconstruction

Simulation

 

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© 2019 ETH Zurich | Imprint | Disclaimer | 4 September 2012
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