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Details
Auger Electron Spectroscopic Studies of Fracture of Nickel-Tungsten Composites and Silicon Nitride
| Author | Hofmann, S.; Gauckler, L.J.; Tillmann, L. | |
| Year of Conference | 1975 | |
| Type | Conference Proceedings | |
| Conference Name | Kolloq ueber Metallkd Anal mit Besonderer Beruecksichtigung der Elektronenstrahl-Mikroanal, 7th, Wien; Published by Springer-Verlag (Mikrochim Acta, Suppl 6), New York, NY | |
| Pages | 373-382 | |
| Custom 1 | CP | |
| Custom 2 | O | |
| Abstract | The Auger electron spectroscopic investigation makes it feasible to determine the chemical constitution of fracture surfaces with high depth resolution (order of magnitude 10 A) and additionally to determine depth profiles of concentration by means of sputtering with argon ions. This has been shown by means of the fracture surface of a metallic substance (nickel-tungsten) and of a ceramic high-temperature material (silicon nitrid). In the first case it was possible to detect this by means of the enrichment of nickel on the tungsten grain boundaries caused by a thermal treatment. In the second case by the occurrence of an oxygen accumulation on the grain boundaries resulting from an addition of MgO. The possibilities and the sources of error were discussed with regard to a quantitative evaluation. [16 Refs; In German, English] | |
| Notes | ! no pdf | |
| Record Number | 25 | |
| Group | nonmet |
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