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Details
Processing and properties of Bi-2212 thick films
| Author | Heeb, B.; Buhl, D.; Lang, Th.; Gauckler, L.J. | |
| Year of Conference | 1993 | |
| Type | Conference Proceedings | |
| Conference Name | Proceedings of the Symposium on Processing of Long Lengths of Superconductors | |
| Conference Location | Pittsburgh, USA | |
| Publisher | Minerals, Metals & Materials Soc (TMS) | |
| Pages | 213-219 | |
| Custom 1 | CP | |
| Custom 2 | SUPRA | |
| Abstract | Bi-2212 thick films were produced by tape casting and partial melting on Ag- substrates. Highly aligned microstructures throughout the oxide thickness of 20 [micro;]m were achieved. A reducing heat treatment optimizing the oxygen stoichiometry of the Bi-2212 phase led to a Tc of 90 K and to a jc of 1.75.104 A/cm2 at 77 K/0 T using the 1 [mu]V/cm criterion. The current-voltage characteristic of the thick films follows the power law E varies directly as j[alpha] at 77 K in zero field. The exponent [alpha] = 5 for the films is considerably smaller than those found for melt processed bulk material. [Author abstract; 10 Refs; In English] | |
| URL | ||
| Record Number | 108 | |
| Group | nonmet |
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